JEOL JSM-6600

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Tool Details

JEOL JSM-6600
Manufacturer
JEOL
Model
JSM-6600
Wafer Size
6"
Vintage
1990
Description

Includes EDX
- scanning microscope
- included EDX option
- 200VAC, 1 phase, 30A, 50/60Hz, 6KVA
- secondary electron image resolution (at 8mm working distance): at 35kV 3.5nm guaranteed and at 1kV 20.0nm atteinable
- magnification: 10x to 300'000x
- accelerating voltage: 0.2 to 40kV (0.2 to 5kV variable in 0.1kV steps, 5 to 40kV variable in 1kV steps)

Approx. Qty
1
Pricing
Please inquire for pricing
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